SOI MOSFET ELECTRICAL CHARACTERIZATION ANALOG APPLICATIONS JUNCTIONLESS NANOWIRE TRANSISTORS SIMULATION NANOELECTRONICS ANALYTICAL MODEL TEMPERATURE NANOWIRE THREE-DIMENSIONAL NUMERICAL SIMULATION SELF-HEATING EFFECT HIGH-K DIELECTRICS TRIPLE GATE METAL GATE FINFET EXTRACTION METHOD LOW TEMPERATURE RELIABILITY JUNCTIONLESS MEASUREMENTS HIGH TEMPERATURE STRAINED DEVICES MODELING SERIES RESISTANCE ROTATED SUBSTRATE LOW-FREQUENCY NOISE MOBILITY DEGRADATION STRAIN MOSFET NUMERICAL SIMULATION