Palavra-chave: MEASUREMENTS

OXIDE CHARGES JUNCTIONLESS NANOWIRE TRANSISTORS HIGH TEMPERATURE JUNCTIONLESS METHODS DENTAL CARIES GC SOI MOSFET SERIES ASSOCIATION MODELING DEVICE PROCESSING THRESHOLD VOLTAGE ANALOG APPLICATIONS PARASITIC BIPOLAR EFFECTS SOI MOSFET MULTIPLE GATE SUBSTRATE EFFECT MISMATCH ELECTRICAL CHARACTERIZATION DIAGNOSIS VERTICAL HYDROFOIL SIMULATION FORCE AND PRESSURE FINFET LOW TEMPERATURE