Palavra-chave: COMPACT MODELING

LOW-FREQUENCY NOISE NANOWIRE-BASED TRANSISTORS JUNCTIONLESS NANOWIRE TRANSISTORS TRIPLE GATE GATE-ALL-AROUND FINFET DRAIN CURRENT DOUBLE GATE TRANSISTORS TCAD TRIDIMENSIONAL SIMULATION ELECTRICAL CHARACTERIZATION VARIABILITY ANALYTICAL MODEL LEAKAGE CURRENT GATE INDUCED DRAIN LEAKAGE MODELING SPICE CIRCUIT SIMULATOR TEST CHIP TRAP DENSITY TRANSCAPACITANCE CAPACITANCE TEMPERATURE STACKED NANOWIRES CRYOGENICS CRYOELECTRONICS SOI MOSFET NANOWIRE SIMULATION